The effect of defect clustering on test transparency and defect levels.
Adit D. SinghC. Mani KrishnaPublished in: VTS (1993)
Keyphrases
- defect detection
- k means
- clustering algorithm
- spectral clustering
- hierarchical clustering
- information theoretic
- clustering method
- outlier detection
- unsupervised learning
- database
- training data
- cluster analysis
- data objects
- learning algorithm
- machine learning
- similarity function
- categorical data
- unsupervised clustering
- real time