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Improved surface roughness modeling and mobility projections in thin film MOSFETs.

O. BadamiEnrico CarusoDaniel LizzitDavid EsseniPierpaolo PalestriLuca Selmi
Published in: ESSDERC (2015)
Keyphrases
  • thin film
  • surface roughness
  • viewpoint
  • multi layer
  • short circuit
  • three dimensional
  • image sequences
  • input output
  • high density
  • specular reflection