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Improved surface roughness modeling and mobility projections in thin film MOSFETs.
O. Badami
Enrico Caruso
Daniel Lizzit
David Esseni
Pierpaolo Palestri
Luca Selmi
Published in:
ESSDERC (2015)
Keyphrases
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thin film
surface roughness
viewpoint
multi layer
short circuit
three dimensional
image sequences
input output
high density
specular reflection