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Minimal Length Diagnostic Tests for Analog Circuits using Test History.

Alfred V. GomesAbhijit Chatterjee
Published in: DATE (1999)
Keyphrases
  • diagnostic tests
  • analog circuits
  • minimal length
  • fault diagnosis
  • digital circuits
  • neural network
  • object oriented
  • data sets
  • genetic algorithm
  • artificial intelligence
  • data mining techniques
  • pattern matching