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Self-Synchrounous Circuits with Completion/Error Detection as a Candidate of Future LSI Resilient for PVT Variations and Aging.
Kunihiro Asada
Makoto Ikeda
Benjamin Stefan Devlin
Taku Sogabe
Published in:
DFT (2010)
Keyphrases
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error detection
error correction
error recovery
fault tolerance
error correcting
data cleansing
long term
fault isolation
high speed
error resilient
neural network
fault tolerant
expert systems
text retrieval
circuit design
error control