Pairwise Testing in the Presence of Configuration Change Cost.
Shin KimotoTatsuhiro TsuchiyaTohru KikunoPublished in: SSIRI (2008)
Keyphrases
- pairwise
- testing process
- similarity measure
- semi supervised
- multi class
- test cases
- loss function
- pairwise interactions
- high cost
- belief propagation
- neural network
- optimal configuration
- machine learning
- graph matching
- cost sensitive
- expected cost
- minimum cost
- pairwise classification
- cost reduction
- learning algorithm
- test suite
- higher order
- point sets
- website
- data sets
- dynamic programming
- markov random field