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Estimating the SEU failure rate of designs implemented in FPGAs in presence of MCUs.

Igor VillaltaUnai BidarteJulen Gomez-CornejoJesús LázaroArmando Astarloa
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • failure rate
  • random variables
  • occurrence probability
  • data sets
  • image processing
  • upper bound
  • hardware implementation
  • production rate