Bias temperature instabilities in 4H SiC metal oxide semiconductor field effect transistors: Insight provided by electrically detected magnetic resonance.
Patrick M. LenahanMark A. AndersR. J. WaskiewiczAivars J. LelisPublished in: Microelectron. Reliab. (2018)
Keyphrases
- magnetic resonance
- mr images
- medical images
- image data
- image registration
- schottky barrier
- mr brain images
- mr imaging
- brain tumors
- brain images
- brain image segmentation
- mr brain
- field effect transistors
- multiple sclerosis
- phase contrast
- metal oxide semiconductor
- magnetic resonance images
- integrated circuit
- boundary conditions
- high density
- image slices