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MCU Tolerance in SRAMs Through Low-Redundancy Triple Adjacent Error Correction.

Luis J. Saiz-AdalidPedro ReviriegoPedro J. GilSalvatore PontarelliJuan Antonio Maestro
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)
Keyphrases
  • error correction
  • channel coding
  • error analysis
  • data hiding
  • error detection
  • error correcting
  • error control
  • response time
  • watermarking scheme
  • low power consumption
  • ldpc codes
  • magnetic tape