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Optimizing Test Wrapper for Embedded Cores Using TSV Based 3D SOCs.

Surajit Kumar RoyChandan GiriSourav GhoshHafizur Rahaman
Published in: ISVLSI (2011)
Keyphrases
  • feature selection
  • statistical tests
  • real time
  • information systems
  • website
  • test data
  • embedded systems
  • multi core processors