Characterisation Of Electroplated Eutectic Sn-Ag Solder.

Z. W. Zhong K. C. Chan Y. H. Chen

Published in: Int. J. Comput. Eng. Sci. (2003)

Keyphrases

electron microscopy
mechanical properties
high temperature
printed circuit boards
failure rate
knowledge base
probability distribution
knowledge discovery
object oriented
markov chain