A Low-Power Enhanced Bitmask-Dictionary Scheme for Test Data Compression.

Vahid Janfaza Payman Behnam Bahjat Forouzandeh Bijan Alizadeh

Published in: ISVLSI (2014)

Keyphrases

test data
low power
power consumption
high speed
low cost
test cases
training data
test set
single chip
logic circuits
data sets
vlsi architecture
image compression
low power consumption
power reduction
ultra low power
digital signal processing
training set
vlsi circuits
database