PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices.
Dawood AlnajiarYukio MitsuyamaMasanori HashimotoTakao OnoyePublished in: IEICE Electron. Express (2013)
Keyphrases
- error detection
- floating gate
- fault tolerance
- error correction
- error recovery
- fault tolerant
- data cleansing
- error correcting
- asynchronous circuits
- load balancing
- low cost
- error resilient
- distributed systems
- peer to peer
- fault isolation
- hardware implementation
- multiple description coding
- high speed
- response time
- reconfigurable hardware
- power reduction
- delay insensitive
- mobile agents
- expert systems
- reconfigurable architecture