• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

On the temperature and voltage dependence of short-term negative bias temperature stress.

Ph. HehenbergerP.-J. WagnerHans ReisingerTibor Grasser
Published in: Microelectron. Reliab. (2009)
Keyphrases