Statistical Performance Modeling and Parametric Yield Estimation of MOS VLSI.
Tat-Kwan YuSung-Mo KangI. N. HajiTimothy N. TrickPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1987)
Keyphrases
- statistical modeling
- data mining
- information retrieval
- statistical analysis
- vlsi circuits
- semi parametric
- robust estimation
- modeling language
- parametric models
- information theoretic
- parameter estimation
- data driven
- high speed
- knowledge base
- hypothesis testing
- modeling method
- accurate estimation
- computer vision
- vlsi implementation
- real time