Total Deep Variation for Noisy Exit Wave Reconstruction in Transmission Electron Microscopy.
Thomas PinetzErich KoblerChristian DobersteinBenjamin BerkelsAlexander EfflandPublished in: SSVM (2021)
Keyphrases
- transmission electron microscopy
- high resolution
- x ray
- tomographic images
- noisy data
- data sets
- three dimensional
- electron microscopy
- image reconstruction
- machine learning
- reconstructed image
- low resolution
- computer vision
- image compression
- medical images
- reconstruction method
- shape recovery
- compressive sensing
- noisy environments
- compressed sensing
- reconstruction process
- scheduling problem
- high quality
- sea surface