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Variability analysis for sub-100 nm PD/SOI CMOS SRAM cell.

Rajiv V. JoshiSaibal MukhopadhyayDonald W. PlassYuen H. ChanChing-Te ChuangAnirudh Devgan
Published in: ESSCIRC (2004)
Keyphrases
  • statistical analysis
  • high speed
  • information systems
  • image analysis
  • power consumption
  • database
  • data sets
  • silicon on insulator