Investigation of Read Disturb for Hf0.5Zr0.502 Ferroelectric Field-Effect Transistors Based Neuromorphic Applications.
Xinze LiYiqin ZengYuxuan WuYing SunJunru QuChengji JinJiani GuRongzong ShenGaobo LinDawei GaoXiao YuBing ChenRan ChengGenquan HanPublished in: IRPS (2024)