Login / Signup
WIT: Window intensity test detector and descriptor.
T. W. U. Madhushani
D. H. S. Maithripala
J. V. Wijayakulasooriya
Published in:
ICIIS (2016)
Keyphrases
</>
three dimensional
object recognition
window size
sliding window
data sets
neural network
feature space
image classification
detection method
test data
shape descriptors