Glitch-Aware Pattern Generation and Optimization Framework for Power-Safe Scan Test.
V. R. DevanathanC. P. RavikumarV. KamakotiPublished in: VTS (2007)
Keyphrases
- pattern generation
- global optimization
- probabilistic model
- main contribution
- databases
- power consumption
- optimization algorithm
- software engineering
- constrained optimization
- conceptual framework
- convex optimization
- optimization method
- real time
- decision trees
- social networks
- machine learning
- data mining
- neural network
- data sets