Feature Clustering for Open-Set Recognition in LCD Manufacturing.
Francesco CursiMax WittstammWai Lam SungAkashdeep RoyChao ZhangBenny DrescherPublished in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
- object recognition
- clustering algorithm
- recognition rate
- clustering method
- recognition accuracy
- unsupervised learning
- automatic recognition
- k means
- image features
- character recognition
- hierarchical clustering
- data clustering
- pattern recognition
- document clustering
- discrimination power
- feature vectors
- motion blur
- activity recognition
- multiple features
- image formation
- quality control
- feature importance
- image matching
- human activities
- data sets
- self organizing maps
- action recognition
- feature extraction
- computer vision
- neural network