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An enhanced MMC topology with DC fault ride-through capability.

Xiaoqian LiWenhua LiuQiang SongHong RaoShukai Xu
Published in: IECON (2013)
Keyphrases
  • fault diagnosis
  • fault detection
  • multi class
  • expert systems
  • decision making
  • fault model
  • cell complexes
  • artificial intelligence
  • image processing
  • real time embedded systems