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600 V, low-leakage AlGaN/GaN MIS-HEMT on bulk GaN substrates.
Muhammad Alshahed
Mohammed Alomari
Christine Harendt
Joachim N. Burghartz
C. Wachter
T. Bergunde
S. Lutgen
Published in:
ESSDERC (2016)
Keyphrases
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structuring elements
high density
information systems
pattern recognition
digital libraries
gray scale
real time
data sets
decision trees
image analysis
binary images