Drastic reduction of keep-out-zone in 3D-IC by local stress suppression with negative-CTE filler.

Hisashi Kino Takafumi Fukushima Tetsu Tanaka

Published in: 3DIC (2016)

Keyphrases

positive and negative
edge detection
reduction method
database
data sets
artificial intelligence
cooperative
integrated circuit
databases
neural network
e learning
wireless sensor networks