Login / Signup

When bad things happen to good chips (panel session).

N. S. NagarajAndrzej J. StrojwasSani R. NassifRay HokinsonTak YoungWonjae L. KangDavid OverhauserSung-Mo Kang
Published in: DAC (2000)
Keyphrases
  • integrated circuit
  • high speed
  • computer systems
  • high density
  • high end
  • data sets
  • real time
  • information systems
  • decision making
  • functional units