A Multilayer Data Copy Scheme for Low Cost Test with Controlled Scan-In Power for Multiple Scan Chain Designs.
Shih Ping LinChung-Len LeeJwu E. ChenJi-Jan ChenKun-Lun LuoWen Ching WuPublished in: ITC (2006)
Keyphrases
- data sets
- low cost
- database
- synthetic data
- data collection
- data acquisition
- test data
- data structure
- data processing
- computer systems
- image data
- original data
- raw data
- missing data
- data sources
- data analysis
- real time
- knowledge discovery
- data mining techniques
- data points
- prior knowledge
- training data
- experimental data
- web pages
- feature selection
- data mining