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On the quality of test vectors for post-silicon characterization.

Matthias SauerAlexander CzutroBernd BeckerIlia Polian
Published in: ETS (2012)
Keyphrases
  • high quality
  • high density
  • machine learning
  • feature vectors
  • low cost
  • high speed
  • test data
  • real time
  • databases
  • website
  • image sequences
  • vector space