Applications of Phasor Data Analysis on Scattering Scanning Near-field Optical Microscopy Investigations.
Denis E. TrancaArcadie SobetkiiRadu HristuStefan G. StanciuCatalin StoichitaGeorge A. StanciuPublished in: ICTON (2023)
Keyphrases
- data analysis
- multiple scattering
- image analysis
- data collection
- machine learning
- data processing
- multi aspect
- long range
- high throughput
- charge coupled device
- fiber optic
- scan data
- data visualization
- knowledge discovery
- big data
- data mining
- business intelligence
- digital forensics
- structured light
- high dimensional data
- cluster analysis
- refractive index
- data warehouse
- pattern discovery
- biological data
- life sciences
- electron beam
- microscopy images
- light source
- high speed
- closely spaced
- atmospheric turbulence
- wave equation
- direction of arrival