Studies of defect states of ZnO thin films under different annealing conditions.

Hooyoung Song Jae-Hoon Kim Eun Kyu Kim

Published in: Microelectron. J. (2009)

Keyphrases

thin film
multi layer
grain size
high density
short circuit
solar cell
simulated annealing
sufficient conditions
neural network
room temperature
image data
initial conditions
plasma etching