Fabrication and Characterization of Emerging Nanoscale Memory.
SangBum KimYuan ZhangByoungil LeeMarissa CaldwellH.-S. Philip WongPublished in: ISCAS (2009)
Keyphrases
- high density
- low memory
- memory usage
- memory requirements
- integrated circuit
- atomic force microscopy
- random access
- memory footprint
- memory size
- main memory
- information systems
- computational power
- memory space
- image processing
- computing power
- data mining
- mechanical properties
- memory management
- working memory
- information technology
- bayesian networks
- multiscale
- real world
- associative memory
- expert systems
- data center
- high speed