Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead.

R. D. (Shawn) Blanton Subhasish Mitra

Published in: VLSI Design (2005)

Keyphrases

circuit design
digital world
test cases
high speed
road traffic
software testing
traffic monitoring
data integration
road network
aerial images
testing process
digital technologies
road surface
traffic accidents
transportation networks
real time
test set
neural network