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GC-eDRAM With Body-Bias Compensated Readout and Error Detection in 28-nm FD-SOI.

Robert GitermanAndrea BonettiAndreas BurgAdam Teman
Published in: IEEE Trans. Circuits Syst. II Express Briefs (2019)
Keyphrases
  • error detection
  • error correction
  • silicon on insulator
  • error recovery
  • data cleansing
  • error correcting
  • human body
  • fault tolerance
  • error resilient
  • fault isolation
  • error control
  • digital libraries
  • fault tolerant