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RRAM Reliability/Performance Characterization through Array Architectures Investigations.

Cristian ZambelliAlessandro GrossiPiero OlivoChristian WalczykChristian Wenger
Published in: ISVLSI (2015)
Keyphrases
  • reliability analysis
  • real time
  • highly reliable
  • programmable logic
  • information systems
  • feature selection
  • case study
  • failure rate
  • focal plane
  • neural architectures