Short Survey of Artificial Intelligent Technologies for Defect Detection in Manufacturing.
Elpiniki I. PapageorgiouTheodosis TheodosiouGeorge MargetisNikolaos DimitriouPaschalis CharalampousDimitrios TzovarasIoannis SamakovlisPublished in: IISA (2021)
Keyphrases
- artificial intelligent
- defect detection
- automated visual inspection
- quality control
- semiconductor manufacturing
- neural network
- textured surfaces
- human factors
- literature review
- manufacturing systems
- manufacturing processes
- data collection
- recent trends
- web technologies
- production planning
- emerging technologies
- learning systems
- computer science
- feature extraction
- data sets