Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint.
Sying-Jyan WangKatherine Shu-Min LiShih-Cheng ChenHuai-Yan ShiuYun-Lung ChuPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)