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Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint.

Sying-Jyan WangKatherine Shu-Min LiShih-Cheng ChenHuai-Yan ShiuYun-Lung Chu
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2009)
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