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A Built-In Self-Repair Scheme for 3-D RAMs With Interdie Redundancy.
Che-Wei Chou
Yu-Jen Huang
Jin-Fu Li
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2013)
Keyphrases
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multiple description coding
data mining
information retrieval
learning algorithm
case study
face recognition
multiscale
learning scheme
detection scheme