Black-box identity testing of depth-4 multilinear circuits.
Shubhangi SarafIlya VolkovichPublished in: STOC (2011)
Keyphrases
- black box
- white box
- test cases
- integration testing
- white box testing
- black boxes
- higher order
- software testing
- hybrid systems
- state transition
- rule extraction
- neural network
- delay insensitive
- test suite
- principal component analysis
- database
- depth information
- error prone
- test set
- circuit design
- high speed
- testing process
- computational intelligence
- feature extraction
- machine learning