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Single Test Clock with Programmable Clock Enable Constraints for Multi-clock Domain SoC ATPG Testing.
Chin Hai Ang
Published in:
Asian Test Symposium (2013)
Keyphrases
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high speed
power consumption
test cases
general purpose
duty cycle
databases
computer vision
lower bound
search engine
website
real time
co occurrence
artificial intelligence
neural network
domain independent
software testing
test generation
data sets