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Simulating Open-Via Defects.
Stefan Spinner
Jie Jiang
Ilia Polian
Piet Engelke
Bernd Becker
Published in:
ATS (2007)
Keyphrases
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machine learning
data sets
information systems
database
databases
neural network
social networks
decision making
image processing
multimedia
image sequences
learning environment
machine vision
defect detection