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Local Diagonal Extrema Pattern: A New and Efficient Feature Descriptor for CT Image Retrieval.

Shiv Ram DubeySatish Kumar SinghRajat Kumar Singh
Published in: IEEE Signal Process. Lett. (2015)
Keyphrases
  • image retrieval
  • feature descriptors
  • three dimensional
  • x ray
  • multiscale
  • medical images
  • high quality
  • multiresolution
  • scale space
  • feature points
  • local binary pattern
  • shape features