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Thermal-Safe Test Scheduling for Core-Based System-on-Chip Integrated Circuits.
Paul M. Rosinger
Bashir M. Al-Hashimi
Krishnendu Chakrabarty
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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integrated circuit
scheduling problem
infrared
built in self test
test data
test cases
hardware and software
round robin
dynamic scheduling
power consumption
scheduling algorithm
power plant
flexible manufacturing systems