C
search
search
reviewers
reviewers
feeds
feeds
assignments
assignments
settings
logout
Test Planning for Core-based Integrated Circuits under Power Constraints.
Breeta SenGupta
Dimitar Nikolov
Urban Ingelsson
Erik Larsson
Published in:
J. Electron. Test. (2017)
Keyphrases
</>
integrated circuit
built in self test
planning problems
power consumption
constraint programming
image processing
constrained optimization
domain independent
constraint satisfaction
electron beam
neural network
test cases
data sets
motion planning
ai planning
plan generation
temporal planning