Test circuits for substrate noise evaluation in CMOS digital ICs.

Makoto Nagata Takafumi Ohmoto Jin Nagai Takashi Morie Atsushi Iwata

Published in: ASP-DAC (2001)

Keyphrases

circuit design
delay insensitive
mixed signal
high speed
vlsi circuits
analog vlsi
low cost
evaluation model
image noise
low power
image restoration
median filter
random noise
noise level
evaluation method
noise reduction
wide dynamic range