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A Method to Find Don't Care Values in Test Sequences for Sequential Circuits.
Yoshinobu Higami
Shin-ya Kobayashi
Yuzo Takamatsu
Seiji Kajihara
Irith Pomeranz
Published in:
ICCD (2003)
Keyphrases
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computational cost
detection method
preprocessing
significant improvement
test sequences
objective function
experimental evaluation
pairwise
high accuracy
clustering method
synthetic data
databases
machine learning
feature space
medical images
test set