A New Mura Defect Inspection Way for TFT-LCD Using Level Set Method.
Xin BiChungang ZhuangHan DingPublished in: IEEE Signal Process. Lett. (2009)
Keyphrases
- level set method
- liquid crystal displays
- tft lcd
- thin film transistor
- level set
- image segmentation
- active contours
- high resolution
- image formation
- energy functional
- higher resolution
- motion blur
- deformable models
- thin film
- eye tracking
- active contour model
- display devices
- partial differential equations
- neural network
- goal programming
- gray scale
- image processing