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Partial Reset Methodology and Experiments for Improving Random-Pattern Testability and BIST of Sequential Circuits.

Huy NguyenRabindra K. RoyAbhijit Chatterjee
Published in: J. Electron. Test. (1999)
Keyphrases
  • pattern matching
  • built in self test
  • pattern detection
  • delay insensitive
  • real time
  • neural network
  • information systems
  • decision trees
  • multi agent
  • search algorithm
  • artificial neural networks
  • pattern discovery