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Multi-mode-segmented scan architecture with layout-aware scan chain routing for test data and test time reduction.
Po-Chang Tsai
Sying-Jyan Wang
Published in:
IET Comput. Digit. Tech. (2008)
Keyphrases
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test data
test cases
test set
training data
data sets
training and test data
training set
similarity measure
training samples
search based testing
database
learning algorithm
wireless sensor networks
text mining
routing protocol
software testing