A secure scan chain test scheme exploiting retention loss of memristors.
Yanping GongFengyu QianLei WangPublished in: ISCAS (2017)
Keyphrases
- key distribution
- authentication scheme
- long term
- public key encryption
- statistical tests
- authentication protocol
- digital signature scheme
- secure communication
- provably secure
- test data
- encryption key
- secret sharing
- chosen plaintext
- authentication mechanism
- key management scheme
- protection scheme
- key exchange
- standard model
- multi party
- security issues
- information loss
- test cases