Deep Convolutional Neural Networks with Residual Blocks for Wafer Map Defect Pattern Recognition.
Zemenu Endalamaw AmogneFu-Kwun WangJia-Hong ChouPublished in: IWANN (1) (2021)
Keyphrases
- convolutional neural networks
- pattern recognition
- convolutional network
- signal processing
- image processing
- image analysis
- computer vision
- maximum a posteriori
- machine learning
- neural network
- integrated circuit
- pattern classification
- data sets
- dimensionality reduction
- feature extraction
- support vector machine svm
- machine vision
- pattern analysis
- rough sets
- defect detection
- semiconductor manufacturing
- fractal image coding
- support vector