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Automatic Test Plan Generation for Analog Integrated Circuits - A Practical Approach.
Ravindranath Naiknaware
G. N. Nandakumar
Rajeev Arora
John Larkin
Published in:
VLSI Design (1993)
Keyphrases
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integrated circuit
plan generation
built in self test
plan recognition
electron beam
signal processing
plan execution
printed circuit boards
artificial intelligence
mobile robot
domain specific
planning problems
temporal planning