Clock Period-Jitter Measurement With Low-Noise Runtime Calibration for Chips in FinFET CMOS.
Jinn-Shyan WangPei-Yuan ChouPublished in: IEEE Trans. Circuits Syst. I Regul. Pap. (2024)
Keyphrases
- high speed
- data acquisition
- power consumption
- measurement error
- high noise
- low signal to noise ratio
- low power
- camera calibration
- weak signal detection
- noisy data
- low cost
- packet loss
- random noise
- real time
- noise level
- noise reduction
- image processing
- imaging devices
- analog vlsi
- chip design
- frame rate
- gaze estimation
- field of view
- missing data
- computer systems
- computer vision